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Atomic force microscope probe based controlled pushing for nanotribological characterization

2004

Article

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Author(s): Sitti, Metin
Journal: IEEE/ASME Transactions on mechatronics
Volume: 9
Number (issue): 2
Pages: 343--349
Year: 2004
Publisher: IEEE

Department(s): Physical Intelligence
Bibtex Type: Article (article)

BibTex

@article{sitti2004atomic,
  title = {Atomic force microscope probe based controlled pushing for nanotribological characterization},
  author = {Sitti, Metin},
  journal = {IEEE/ASME Transactions on mechatronics},
  volume = {9},
  number = {2},
  pages = {343--349},
  publisher = {IEEE},
  year = {2004}
}