Physical Intelligence

KB scanning of X-ray beam for Laue microdiffraction on accelero-phobic samples: application to in situ mechanically loaded nanowires

2016

Article

zwe-csfm


Author(s): Leclere, C. and Cornelius, T. W. and Ren, Z. and Robach, O. and Micha, J. S. and Davydok, A. and Ulrich, O. and Richter, G. and Thomas, O.
Journal: Journal of Synchrotron Radiation
Volume: 23
Pages: 1395-1400
Year: 2016

Department(s): CSF Materials
Bibtex Type: Article (article)

DOI: 10.1107/S1600577516013849

BibTex

@article{escidoc:4123483,
  title = {KB scanning of X-ray beam for Laue microdiffraction on accelero-phobic samples: application to in situ mechanically loaded nanowires},
  author = {Leclere, C. and Cornelius, T. W. and Ren, Z. and Robach, O. and Micha, J. S. and Davydok, A. and Ulrich, O. and Richter, G. and Thomas, O.},
  journal = {Journal of Synchrotron Radiation},
  volume = {23},
  pages = {1395-1400},
  year = {2016},
  doi = {10.1107/S1600577516013849}
}