Physical Intelligence

Titanium-silicon oxide film structures for polarization-modulated infrared reflection absorption spectroscopy

2009

Article

zwe-csfm


Author(s): Dunlop, I. E. and Zorn, S. and Richter, G. and Srot, V. and Kelsch, M. and van Aken, P. A. and Skoda, M. and Gerlach, A. and Spatz, J. P. and Schreiber, F.
Journal: Thin Solid Films
Volume: 517
Number (issue): 6
Pages: 2048-2054
Year: 2009

Department(s): CSF Materials
Bibtex Type: Article (article)

DOI: 10.1016/j.tsf.2008.10.058

BibTex

@article{escidoc:4123503,
  title = {Titanium-silicon oxide film structures for polarization-modulated infrared reflection absorption spectroscopy},
  author = {Dunlop, I. E. and Zorn, S. and Richter, G. and Srot, V. and Kelsch, M. and van Aken, P. A. and Skoda, M. and Gerlach, A. and Spatz, J. P. and Schreiber, F.},
  journal = {Thin Solid Films},
  volume = {517},
  number = {6},
  pages = {2048-2054},
  year = {2009},
  doi = {10.1016/j.tsf.2008.10.058}
}