KB scanning of X-ray beam for Laue microdiffraction on accelero-phobic samples: application to in situ mechanically loaded nanowires
2016
Article
zwe-csfm
| Author(s): | Leclere, C. and Cornelius, T. W. and Ren, Z. and Robach, O. and Micha, J. S. and Davydok, A. and Ulrich, O. and Richter, G. and Thomas, O. |
| Journal: | Journal of Synchrotron Radiation |
| Volume: | 23 |
| Pages: | 1395-1400 |
| Year: | 2016 |
| Department(s): | CSF Materials |
| Bibtex Type: | Article (article) |
| DOI: | 10.1107/S1600577516013849 |
|
BibTex @article{escidoc:4123483,
title = {KB scanning of X-ray beam for Laue microdiffraction on accelero-phobic samples: application to in situ mechanically loaded nanowires},
author = {Leclere, C. and Cornelius, T. W. and Ren, Z. and Robach, O. and Micha, J. S. and Davydok, A. and Ulrich, O. and Richter, G. and Thomas, O.},
journal = {Journal of Synchrotron Radiation},
volume = {23},
pages = {1395-1400},
year = {2016},
doi = {10.1107/S1600577516013849}
}
|
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