Physical Intelligence

In situ bending of an Au nanowire monitored by micro Laue diffraction

2015

Article

zwe-csfm


Author(s): Leclere, C. and Cornelius, T. W. and Ren, Z. and Davydok, A. and Micha, J. S. and Robach, O. and Richter, G. and Belliard, L. and Thomas, O.
Journal: Journal of Applied Crystallography
Volume: 48
Pages: 291-296
Year: 2015

Department(s): CSF Materials
Bibtex Type: Article (article)

DOI: 10.1107/S1600576715001107

BibTex

@article{escidoc:4123484,
  title = {In situ bending of an Au nanowire monitored by micro Laue diffraction},
  author = {Leclere, C. and Cornelius, T. W. and Ren, Z. and Davydok, A. and Micha, J. S. and Robach, O. and Richter, G. and Belliard, L. and Thomas, O.},
  journal = {Journal of Applied Crystallography},
  volume = {48},
  pages = {291-296},
  year = {2015},
  doi = {10.1107/S1600576715001107}
}