Titanium-silicon oxide film structures for polarization-modulated infrared reflection absorption spectroscopy
2009
Article
zwe-csfm
| Author(s): | Dunlop, I. E. and Zorn, S. and Richter, G. and Srot, V. and Kelsch, M. and van Aken, P. A. and Skoda, M. and Gerlach, A. and Spatz, J. P. and Schreiber, F. |
| Journal: | Thin Solid Films |
| Volume: | 517 |
| Number (issue): | 6 |
| Pages: | 2048-2054 |
| Year: | 2009 |
| Department(s): | CSF Materials |
| Bibtex Type: | Article (article) |
| DOI: | 10.1016/j.tsf.2008.10.058 |
|
BibTex @article{escidoc:4123503,
title = {Titanium-silicon oxide film structures for polarization-modulated infrared reflection absorption spectroscopy},
author = {Dunlop, I. E. and Zorn, S. and Richter, G. and Srot, V. and Kelsch, M. and van Aken, P. A. and Skoda, M. and Gerlach, A. and Spatz, J. P. and Schreiber, F.},
journal = {Thin Solid Films},
volume = {517},
number = {6},
pages = {2048-2054},
year = {2009},
doi = {10.1016/j.tsf.2008.10.058}
}
|
|